| Final Report on Test Generation |
college |
| topic: |
ECE553 (Testing and Testability of Digital Systems) |
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Problem Statement:
1. Given a circuit description, generate a compact test set with high fault coverage.
2. Using test set from (1), determine whether three supplied circuits contain
an injected fault.
3. Finally, determine the fault location in a fourth supplied circuit.
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| formats: |
Adobe PDF (151.6kB), PostScript (394.8kB), TeX (1.1kB)
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1997-11-30 |
quality 4 |
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