Final Report on Test Generation college
topic: ECE553 (Testing and Testability of Digital Systems)
Problem Statement:
1. Given a circuit description, generate a compact test set with high fault coverage.
2. Using test set from (1), determine whether three supplied circuits contain an injected fault.
3. Finally, determine the fault location in a fourth supplied circuit.
formats: Adobe PDF (151.6kB), PostScript (394.8kB), TeX (1.1kB) 1997-11-30 quality 4
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[Zak Smith] [zak@computer.org] [/~zak/documents/college/ece553-final-report]
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